Balakrishnan, G., R. Velavan, and S. Syed Naser. “Characterization of P-Type Nickel Oxide (NiO) Thin Films Prepared by RF Magnetron Sputtering”. Journal of Surface Science and Technology 36, no. 1-2 (August 20, 2020): 01–05. Accessed April 29, 2024. http://www.informaticsjournals.com/index.php/jsst/article/view/22591.